Sampling interval — where it appears
Named by 4 essays across 2 fields — each of them below, with the objects they name alongside it.
What the instrument reports
A spectrophotometer sees a sample through a slit of finite width, at a finite number of wavelengths. What it writes down is the truth convolved with its own bandpass, and nothing in the file says which values were measured and which were invented.
Three numbers cannot see a line
An instrument that returns three filtered readings of a spectrum determines a three-dimensional projection of it and is exactly blind to the other seventy-eight. On daylight that costs almost nothing; on a fluorescent tube, three quarters of the lamp lies in the part no reading reaches, and adding filters recovers it slowly.
The line can be in the sample
The rule for which tabulation defect to fix compares the light's narrowest feature with the grid's step, and it named its own failure case — a sample with structure narrower than the step. Given one, a two-nanometre notch under a thermal source with no feature at all costs 2.1 colour differences at five nanometres and moves 2.0 when the grid slides, which is what a fluorescent tube costs on a smooth pigment. Under that tube a notch twelve nanometres wide, more than twice the step, moves 8.1 when it sits on the mercury line.
The cost of a steep notch repeats every step
A Gaussian notch is safe on a five-nanometre grid once it is a couple of steps wide. A flat-bottomed notch with steep sides never is. Its cost on the grid rises and falls with its width, with the step as its period — 0.02 colour differences at ten nanometres, 1.99 at twelve and a half, 0.03 at twenty — and it does not die away as the notch widens. What sets its size is how fast the edges rise, and an interference filter's edges rise in under a nanometre.
Named alongside it
The objects these essays reach for when they reach for this one.
Measurement errorReflectanceSpectral structureAliasingBandpassFluorescentQuadratureSpecificationSpectrophotometryTransmittanceWavelength gridΔE